SRAMs have been widely adopted in various aerospace electronic systems systems

SRAMs have been widely adopted in various aerospace electronic systems
systems, and play an important role in the delay, area, power and criticality
Reliability In aerospace applications, SRAMs have a fundamental limit
this constitutes a challenge in the reliability induced by energy particles.
Therefore, disturbed individual events (SEUs) represent a serious reliability error
mechanism that can cause a malfunction of an electronic system
override the stored value. When the load
the particle hits a sensitive node of an integrated circuit, the armor
cargo along your way you can collect and accumulate efficiently
through drift processes. Once a transient voltage pulse is generated
of the accumulated load is above the switching threshold of the
circuit, the value stored in this sensitive node will be changed.

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